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SU: Dept. of Earth Sciences
MicroProbe Lab |
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JEOL JXA 8600 Superprobe: Scanning Electron Microscope/Microprobe:
Five Wavelength Dispersive Detectors, one Energy Dispersive Detector, and one Cathodoluminescence Camera Automation Hardware and Software from Geller MicroAnalytical |
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JEOL 8600: Sample air lock and insertion probe closeup. Note optical microscope and EDS above Air Lock. | |
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JEOL 8600: Custom and Commercial Sample holders: Custom 6 sample 1" round samples: upper left Commercial 4 position Thin Section samples: lower left Custom 2 sample 1.25: round samples: upper right Custom 4 position Thick (3mm) Section Samples: lower right |
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1" Acrylic Mount: Left 1" Epoxy Mount: Right |
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Denton Vacuum DV502A Carbon Coater
w/HiRes 100 Cr coater |
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Denton DV502A C coater closeup
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Denton DV502A: Closeup of rotating spindle head for Al tabs: Note - epoxy mount to the left of spindle
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Denton DV502A: Closeup of graphite rod assembly
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| Secondary Electron Imagery | BackScatter Electron Imagery |
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Links
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Sites
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Tutorials
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Software
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Cheatham's Instrumentation Pages - SEM/EMPA
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| Univ Oregon EBMA Lecture Notes
a lecture series by Dan Weill, Jack Rice, Michael Shaffer and John Donovan |
ImageJ 1.33 for MacOSX
NIH Image for older Mac operating systems Scion Image Beta 4.02 for Windows 95 to XP |
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| JEOL's A Guide to Scanning Microscope Observations (pdf) |
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© 2005 Michael M. Cheatham
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