Electron Microscopy

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JEOL 8600
The JXA8600 is used for imaging and elemental analysis of minerals, fossils, and rocks. Image modes include secondary electron and backscattered electron modes. Upgrade of this instrument to include full electron probe X-ray microanalysis and cathode luminescence imaging capabilities was made possible with funding from NSF's Instrumentation & Facilities Program, and cost-shared by Syracuse University. This instrument is used regularly by undergraduate and graduate researchers as well as in various graduate and undergraduate courses.

JEOL 733
The JEOL 733 shown above is one of three JEOL 733's that we have in the department. We use the JEOL 733 as a test bed for electron microscopy technique development. Currently it is set up for Electron Backscatter Diffraction studies.

Denton 502A Coater
Shown above is the Denton 502A Carbon and Metal Coater. We typically coat with Carbon but we have the ability to coat with Cr, Cu, and Al as well.

Struers automated grinder and polisher
The photo to the left shows the Struers RotoPol-35 and PdM-Force20 grinder/polisher. This instrument is used to grind and polish standard geological thin sections, geological thick sections, and grain mounts. Various specialized holders have been made by the SU Physics Machine ship to accommodate various sample sizes.

Hillquist Thin Section Cut-off saw and cup grinder
The picture to the left shows our rather old but venerable Hillquist thin section cut-off saw and cup grinder.

Buehler Thin Section press
Shown to the left is our Buehler brand Thin Section press used to provide reproducable epoxy thickness when bonding rock billets to frosted glass slides.

Olympus Binocular Microscope
The image on the left is of one of our hi quality Olympus Binocular Microscopes. This is used to determine the quality of the surface finish on our polished thin sections and grain mounts.